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Author: D. Morgan
Publisher: Institution Of Engineering And Technology
Keywords: measurement, electrical, series, iet, handbook, testing, emc
Number of Pages: 304
Published: 1905-06-16
List price: $120.00
ISBN-10: 0863417566
ISBN-13: 9780863417566
This handbook is concerned with most aspects of electromagnetic compatibility and addresses many of the technical and managerial issues which are of concern to designers and manufacturers of commercial and military electronic equipment. The primary focus of the book is on EMC testing. It discusses the numerous test methods in relation to the EMC Standards for which they are required. As the book has been written with the aim of being accessible to both technical staff and management, it has technical sections devoted to such issues as basic antenna theory and EMC testing practices, as well as
Author: S.V Gupta
Publisher: Taylor & Francis
Keywords: measurement, science, technology, series, hydrometry, density, practical
Number of Pages: 352
Published: 2002-07-15
List price: $173.95
ISBN-10: 0750308478
ISBN-13: 9780750308472
Provides information on mass metrology, highlighting the principles of physics involved and the technology needed to measure the density of solids and liquids to high precision to meet metrology industry standards.
Author: Nihal Kularatna
Publisher: The Institution of Engineering and Technology
Keywords: measurement, electrical, testing, instrumentation, analogue, digital
Number of Pages: 645
Published: 2002-09-30
List price: $125.00
ISBN-10: 0852969996
ISBN-13: 9780852969991
A state-of-the-art review of modern families of digital instruments. For each family, the author covers internal design, use and applications, highlighting their advantages and limitations from a practical application viewpoint. New enabling semiconductor technology offers new capabilities to instrument designers and the text treats digital instrument families including data converters, signal processors and modern sensors. This title is an update of the author’s earlier work, ’Modern Electronic Test and Measuring Instruments.’Also available: Adaptive Array Principles - ISBN
Author: A. Fantom
Publisher: The Institution of Engineering and Technology
Keywords: measurement, iee, series, electrical, power, frequency, microwave, radio
Number of Pages: 290
Published: 1990-12-01
List price: $118.00
ISBN-10: 0863411207
ISBN-13: 9780863411205
Includes: Introduction to calorimeters. Dry load calorimeters. Thermoelectric power meters. Diode power meters. Calibration and comparison techniques. Connectors and adapters. Instruments and techniques for pulsed power measurements. Voltage current measurements.Also available: Radio Frequency and Microwave Power Measurement - ISBN 0863411207 Ferrites at Microwave Frequencies - ISBN 0863410642The Institution of Engineering and Technology is one of the world’s leading professional societies for the engineering and technology community. The IET publishes more than 100 new titles every year
Author: I Lira
Publisher: Taylor & Francis
Keywords: measurement, series, science, technology, guidance, practical, uncertainty, fundamentals, evaluating
Number of Pages: 251
Published: 2002-06-15
List price: $152.95
ISBN-10: 0750308400
ISBN-13: 9780750308403
Details the theoretical framework on which the GUM is based and provides additional material on more advanced topics such as least-squares adjustment and Bayesian statistics.
Author: C.F Dietrich
Publisher: Taylor & Francis
Keywords: measurement, series, science, technology, industrial, scientific, calibration, probability, statistics, uncertainty
Number of Pages: 554
Published: 1991-01-01
List price: $299.95
ISBN-10: 0750300604
ISBN-13: 9780750300605
All measurements are subject to error because no quantity can be known exactly; hence, any measurement has a probability of lying within a certain range. The more precise the measurement, the smaller the range of uncertainty. Uncertainty, Calibration and Probability is a comprehensive treatment of the statistics and methods of estimating these calibration uncertainties. The book features the general theory of uncertainty involving the combination (convolution) of non-Gaussian, student t, and Gaussian distributions; the use of rectangular distributions to represent systematic uncertainties; and
Authors:Manfred Bundschuh, Carol Dekkers,
Publisher: Springer
Keywords: measurement, functional, size, success, benchmarking, compendium, estimating
Number of Pages: 644
Published: 2008-10-24
List price: $99.00
ISBN-10: 3540681876
ISBN-13: 9783540681878
The first step towards success in a software project is to ensure a professional setup. This includes a metrics-based formal estimation process to ensure a solid foundation for project planning. Accurate estimates require quantitative measurements, ideally tool based. In addition, software project managers must also monitor and update these estimates during the project’s lifecycle to control progress and assess possible risks. Based on their many years of practical experience as software managers and consultants, Manfred Bundschuh and Carol Dekkers present a framework of value to anyone