Author:
Publisher: ASM International
Keywords: failure, analysis, november, testing, symposium, proceedings, 31st, international, istfa
Number of Pages: 523
Published: 2005-01
List price: $165.00
ISBN-10: 087170823X
ISBN-13: 9780871708236

Authors:ASM International, ASM International,
Publisher: ASM International
Keywords: analysis, book, failure, testing, international, symposium, istfa
Number of Pages: 560
Published: 2008-01-01
List price: $185.00
ISBN-10: 0871707144
ISBN-13: 9780871707147

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.

Author:
Publisher: Asm Intl
Keywords: clara, santa, november, convention, california, center, analysis, failure, 29th, proceedings, international, symposium, testing, istfa
Number of Pages: 518
Published: 2003-01
List price: $165.00
ISBN-10: 0871707888
ISBN-13: 9780871707888

Author: International Symposium for Testing and Failure An
Publisher: ASM International
Keywords: failure, analysis, testing, symposium, international, istfa
Number of Pages: 552
Published: 2006-12-01
List price: $185.00
ISBN-10: 0871708442
ISBN-13: 9780871708441

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.