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ISTFA 2008: International Symposium for Testing and Failure Analysis (Book and CD)

Authors:ASM International, ASM International
Publisher: ASM International
Keywords: analysis, book, failure, testing, international, symposium, istfa
Number of Pages: 560
Published: 2008-01-01
List price: $185.00
ISBN-10: 0871707144
ISBN-13: 9780871707147

Book Description:

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.


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